The laboratory is well equipped with a range of characterization instruments which include 2 probe stations, 2 semiconductor parameter analyzers, precision LCR meter, picoamperometer, 240 MHz dual-channel arbitrary/function generator, DC-5 MHz high voltage amplifier, 3 GHz digital oscilloscope, a large set of laser sources that covers the spectral range from ultraviolet to infrared, white light sources, Xenon arc-lamp (1000 W) coupled with a double grating monochromator, a grating spectrometer coupled with 2 nitrogen cooled CCD cameras in the visible and infrared spectral range up to wavelengths of 2300 nm, Perkin-Elmer photon counting module, and several mandatory workaday instruments (multimeters, voltage and current sources, etc.)

High precision electrical measurements.

The probe station PM8 Suss MicroTech, 200 mm, (fig 1) is furnished with a semiconductor parameter analyzer Agilent B1500A and a precision LCR meter HP 4284A. This test station is mainly used to perform many electrical tasks such as current-voltage (I-V), capacitance-voltage (C-V), capacitance-frequency (C-f), and impedance spectroscopy measurements of micro/nanoelectronic devices.

Electro-optical characterization.

The Alessi probe station is manly dedicated to electro-optical measurements, electroluminescence, in both DC and AC regime and some photovoltaic experiments.
The station is furnished with a semiconductor parameter analyzer HP 4145A, a dual-channel arbitrary function generator Tektronix AFG3252, a broad-band high-voltage amplifier Falco System, 3 GHz oscilloscope LeCroy 7300A. This forms the electrical part of the station.
The optical part of the station includes a grating spectrophotometer SpectraPro 2300i (with visible CCD camera Spec-10 256E and infrared CCD camera OMA V InGaAs 1024) and Perkin-Elmer photon counting module with multichannel scaler SR 430.
Electroluminescence spectra of the light emitting device and light emission intensity are collected with the grating spectrometer. A single photon counting module is used in electroluminescence measurements that require a high sensitivity and in time-resolved electroluminescence measurements with the resolution of up to 5 ns.